首页> 外国专利> Semiconducting component has fourth semiconducting region of lower impurity concentration than first region, enclosing first region, arranged between second and third regions

Semiconducting component has fourth semiconducting region of lower impurity concentration than first region, enclosing first region, arranged between second and third regions

机译:半导体部件具有布置在第二和第三区域之间的,杂质浓度比第一区域低的第四半导体区域,该第四半导体区域包围第一区域

摘要

The component has a first semiconducting region (14) of a first conductor type, a second region of the same type connected to the first at one end surface, a third region of a second type connected to the other end surface and a fourth region with an inner surface in contact with a lateral bounding surface and a lower impurity concentration than the first region. The fourth region encloses the first and is arranged between the second and third. The component has a first semiconducting region (14) of a first conductor type formed by two opposite end surface and a lateral bounding surface joining them, a second region (12) of the same type connected to the first at one end surface, a third region (13) of a second type connected to the other end surface and a fourth region (15) with an inner surface in contact with the lateral bounding surface and a lower impurity concentration than the first region. The fourth region encloses the first and is arranged between the second and third regions. An Independent claim is included for a method of manufacturing a semiconducting component.
机译:该部件具有第一导体类型的第一半导体区域(14),在一个端面上连接到第一类型的第二类型的第二区域,在另一端面上连接到第二类型的第三区域以及具有与横向边界表面接触的内表面和比第一区域低的杂质浓度。第四区域包围第一区域并且布置在第二区域和第三区域之间。该部件具有由两个相对的端面和连接它们的侧向约束面形成的第一导体类型的第一半导体区域(14),同类型的第二区域(12)在一个端面连接到第一半导体区域,第三区域第二类型的第二区域(13)连接到另一端面和第四区域(15),第四区域(15)的内表面与横向边界表面接触,并且杂质浓度低于第一区域。第四区域包围第一区域并且布置在第二区域和第三区域之间。包括关于半导体组件的制造方法的独立权利要求。

著录项

  • 公开/公告号DE10160960A1

    专利类型

  • 公开/公告日2002-06-13

    原文格式PDF

  • 申请/专利权人 SANKEN ELECTRIC CO. LTD. NIIZA;

    申请/专利号DE2001160960

  • 发明设计人 ANDOH HIDEYUKI;

    申请日2001-12-12

  • 分类号H01L29/866;H01L21/329;

  • 国家 DE

  • 入库时间 2022-08-22 00:26:49

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号