首页> 外国专利> METHOD FOR ADJUSTING RELATIVE ATTITUDE OF OBJECT TO BE MEASURED FOR SURFACE PROPERTIES MEASURING MACHINE

METHOD FOR ADJUSTING RELATIVE ATTITUDE OF OBJECT TO BE MEASURED FOR SURFACE PROPERTIES MEASURING MACHINE

机译:调整表面特性测量机的被测对象相对姿态的方法

摘要

PROBLEM TO BE SOLVED: To provide a method for adjusting the attitude of an object to be measured, having a feature region in a surface properties measuring machine. SOLUTION: The method for adjusting the relative attitude of the surface property-measuring machine for measuring the object to be measured, having a feature region comprises a step for positioning a detector in X- and Y-axis directions, and then for measuring a feature region along the X-axis direction; a step for determing the repetition of measurement being carried out, while the X-axis direction is being changed, a step for obtaining n feature points from n sets feature region data and obtaining a feature line from the feature points for obtaining the amount of correction in relative attitude; and a step for adjusting the attitude of the object to be measured based on the amount of realtive attitude correction, thus adjusting the feature region of the object to be measured in parallel with the Y axis.
机译:解决的问题:提供一种用于调整被测量物体的姿态的方法,该物体在表面特性测量机中具有特征区域。解决方案:调整用于测量具有特征区域的表面特性测量机以测量被测物体的相对姿态的方法,该方法包括以下步骤:在X轴和Y轴方向上定位检测器,然后测量特征沿X轴方向的区域;在改变X轴方向的同时,确定重复进行的步骤,是从n组特征区域数据获得n个特征点,并从特征点获得特征线的步骤,以得到校正量。相对的态度根据实际姿势校正量调整被测物的姿势,以与Y轴平行的方式调整被测物的特征区域。

著录项

  • 公开/公告号JP2002340503A

    专利类型

  • 公开/公告日2002-11-27

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20010147035

  • 发明设计人 TAKEMURA FUMIHIRO;KATAYAMA MINORU;

    申请日2001-05-16

  • 分类号G01B5/00;G01B21/00;G12B5/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:13:44

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