首页> 外国专利> Method for measuring particle size of inclusion in metal by emission spectrum intensity of element constituting inclusion in metal, and method for forming particle size distribution of inclusion in metal, and apparatus for executing that method

Method for measuring particle size of inclusion in metal by emission spectrum intensity of element constituting inclusion in metal, and method for forming particle size distribution of inclusion in metal, and apparatus for executing that method

机译:通过构成金属中夹杂物的元素的发射光谱强度来测量金属中夹杂物的粒径的方法,形成金属中夹杂物的粒径分布的方法以及执行该方法的设备

摘要

An electron probe microanalyzer determines the particle size of intermetallic inclusions in a master while scanning an area of &phgr;5 mm located at an arbitrary location on the surface of the master. A calibration curve representative of the relationship between the particle size of intermetallic inclusions and the emission spectrum intensity of an constituent element constituting intermetallic inclusions is generated based on the determined particle size of the intermetallic inclusions. Intermetallic inclusions existing on emission spots on the surface of a test sample are specified based on data of emission spectrum intensity of an element existing on the emission spots, and a particle size of the specified intermetallic inclusions is determined based on the data of emission spectrum intensity and the generated calibration curve.
机译:电子探针显微分析仪在扫描位于母版表面任意位置的φ5mm区域时,确定母版中金属间夹杂物的粒径。基于所确定的金属间夹杂物的粒径,生成代表金属间夹杂物的粒径与构成金属间夹杂物的构成元素的发射光谱强度之间的关系的校准曲线。根据发射点上存在的元素的发射光谱强度的数​​据确定存在于试样表面发射点上的金属间夹杂物,并根据发射光谱强度的数​​据确定所指定的金属间夹杂物的粒径。以及生成的校准曲线。

著录项

  • 公开/公告号US2003168132A1

    专利类型

  • 公开/公告日2003-09-11

    原文格式PDF

  • 申请/专利权人 NSK LTD.;

    申请/专利号US20030258906

  • 发明设计人 WATARU NAGASAWA;

    申请日2003-01-21

  • 分类号C21B7/24;

  • 国家 US

  • 入库时间 2022-08-22 00:12:13

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