首页> 外国专利> Gauge for calibrating three-dimensional coordinate measuring machine and method for calibrating three-dimensional coordinate measuring machine using the gauge

Gauge for calibrating three-dimensional coordinate measuring machine and method for calibrating three-dimensional coordinate measuring machine using the gauge

机译:用于校准三维坐标测量机的量规和使用该规校准三维坐标测量机的方法

摘要

A CMM calibrating gauge includes a block gauge which has a first end face and an opposite second end face and whose length absolute value has been certified, and a sphere fixed to a front surface of the block gauge. A method for calibrating a CMM using the CMM calibrating gauge includes the steps of bringing a probe of the CMM into contact with the first end face of the block gauge to specify planarity of the first end face, bringing the probe into contact with the peripheral surface and the pole point of the sphere to specify coordinates of the center of the sphere relative to the first end face and the diameter of the sphere, bringing the probe into contact with the second end face of the block gauge to measure planarity of the second end face, and bringing the probe into contact with the peripheral surface and the pole point of the sphere to measure coordinates of the center of the sphere relative to the second end face and the diameter of the sphere and revise the specified planarity of the first end face and the specified sphere center coordinates and sphere diameter, thereby specifying three-dimensional dimensions of the CMM calibrating gauge to calibrating the CMM.
机译:CMM校准仪包括:具有第一端面和相对的第二端面并且其长度绝对值已经过验证的块规;以及固定在该块规的前表面上的球体。一种使用CMM校准仪校准CMM的方法,包括以下步骤:使CMM的探针与块规的第一端面接触,以指定第一端面的平面度,使探针与外围表面接触。球体的极点,以指定球体相对于第一端面的中心坐标和球体的直径,从而使探针与块规的第二端面接触以测量第二端的平面度面,并使探头与球体的外围表面和极点接触,以测量球体相对于第二端面的中心的坐标和球体的直径,并修改第一端面的指定平面度以及指定的球心坐标和球直径,从而指定CMM校准量规的三维尺寸来校准CMM。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号