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Spatial and temporal alignment of a scan dump for debug of scan-based designs
Spatial and temporal alignment of a scan dump for debug of scan-based designs
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机译:扫描转储的时空对齐,用于调试基于扫描的设计
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摘要
A method for analyzing a scan dump assigns a first latch to a first value, compares the first latch output to the first value for spatial alignment. The method then assigns a second latch to either a second or third value. The second value corresponds to before an event. The third value corresponds to after an event and may be incremented with ongoing clock cycles.
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