首页> 外国专利> Method of crystallizing amorphous silicon thin film and method of fabricating polysilicon thin film transistor using the crystallization method

Method of crystallizing amorphous silicon thin film and method of fabricating polysilicon thin film transistor using the crystallization method

机译:非晶硅薄膜的晶化方法和使用该晶化方法的多晶硅薄膜晶体管的制造方法

摘要

A method of crystallizing an amorphous silicon thin film is disclosed including the steps of preparing a substrate having a conductive layer, depositing an amorphous silicon thin film on the substrate, forming a metal thin film selectively overlying the amorphous silicon thin film, and performing a heat treatment and application of electric field to the metal thin film; and a method of fabricating a thin film transistor including the steps of preparing a substrate having a conductive layer, forming an active layer of amorphous silicon on the substrate, forming a gate insulating layer and a gate electrode on the active layer, doping the active layer with a first conductivity type impurity using the gate electrode as a mask, forming a metal thin film on the entire surface of the substrate including the active layer doped with the impurity, and performing a heat treatment and applying electric field to the substrate including the metal thin film.
机译:公开了一种使非晶硅薄膜结晶的方法,该方法包括以下步骤:制备具有导电层的基板;在该基板上沉积非晶硅薄膜;形成选择性地覆盖在非晶硅薄膜上的金属薄膜;以及进行加热。电场对金属薄膜的处理和施加;以及一种薄膜晶体管的制造方法,该方法包括以下步骤:制备具有导电层的衬底;在该衬底上形成非晶硅的有源层;在该有源层上形成栅绝缘层和栅电极;掺杂该有源层。使用第一导电型杂质,使用栅电极作为掩模,在包括掺杂有杂质的有源层的基板的整个表面上形成金属薄膜,并进行热处理并向包括金属的基板施加电场薄膜。

著录项

  • 公开/公告号US6558986B1

    专利类型

  • 公开/公告日2003-05-06

    原文格式PDF

  • 申请/专利权人 LG.PHILIPS LCD CO. LTD;

    申请/专利号US19980212164

  • 发明设计人 DUCK-KYUN CHOI;

    申请日1998-12-15

  • 分类号H01L210/00;H01L218/40;

  • 国家 US

  • 入库时间 2022-08-22 00:04:31

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