System and method for testing an integrated circuit device using FFT analysis based on a non-iterative FFT coherency analysis algorithm

摘要

A system tests analog and mixed signal IC devices using an FFT algorithm, supported by a non-iterative Fast Fourier Transform (FFT) coherency analysis algorithm to establish FFT sample-set coherency. A test signal is input into the IC device, and an output signal from the IC device is analyzed using the FFT algorithm. The non-iterative FFT coherency analysis algorithm uses only one “given” value and two approximated values related to a test signal. Based on these given and approximated values, the correct set of all four values required for proper testing of the IC device is determined in a single pass, without the need for multiple iterations.