首页> 外国专利> Gunn effect semiconducting component has base collector space charging zone whose extent is controlled by applied d.c. voltage and current and in which Gunn effect occurs

Gunn effect semiconducting component has base collector space charging zone whose extent is controlled by applied d.c. voltage and current and in which Gunn effect occurs

机译:耿氏效应半导体元件具有基极集电极空间充电区,其范围由施加的直流电控制。电压和电流以及发生耿氏效应的位置

摘要

The device has thick collector, a base collector space charging zone whose extent is controlled by the applied d.c. voltage and current and in which the Gunn effect occurs, whereby the oscillation frequency of the occurring oscillations are controlled by the adjustable working point so that a voltage or current controlled oscillator is produced.
机译:该装置具有较厚的收集器,一个基本的收集器空间充电区,其范围由所施加的直流电控制。电压和电流,并在其中发生耿氏效应,从而通过可调的工作点控制发生的振荡的振荡频率,从而产生电压或电流控制的振荡器。

著录项

  • 公开/公告号DE10136032A1

    专利类型

  • 公开/公告日2003-02-20

    原文格式PDF

  • 申请/专利权人 FORSCHUNGSVERBUND BERLIN E.V.;

    申请/专利号DE2001136032

  • 发明设计人 RUDOLPH MATTHIAS;HEYMANN PETER;

    申请日2001-07-25

  • 分类号H01L29/737;H03B7/14;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:50

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