首页> 外国专利> Tandem mass spectrometry involves positioning dissociation system after ion source and before magnetic sector and using multichannel ion detector for simultaneously detecting ions reaching its detection surface at different positions

Tandem mass spectrometry involves positioning dissociation system after ion source and before magnetic sector and using multichannel ion detector for simultaneously detecting ions reaching its detection surface at different positions

机译:串联质谱法包括在离子源之后,磁扇区之前定位解离系统,并使用多通道离子检测器同时检测到达不同位置到达其检测表面的离子

摘要

Tandem mass spectrometry involves positioning a dissociation system (2) immediately after an ion source (1) and before a magnetic sector (4), and using a multichannel ion detector (7) capable of simultaneously detecting ions reaching its detection surface at different positions. Tandem mass spectrometry involves positioning a dissociation system (2) immediately after an ion source (1) and before a magnetic sector (4), and using a multichannel ion detector (7) capable of simultaneously detecting ions reaching its detection surface at different positions. The process uses a device with a vacuum chamber containing in the order of the ion trajectory, an ion source (1), a dissociation system (2), a fine slit (3), a magnetic sector (4), a fine slit (5), an electrostatic analyzer (6) and a multichannel ion detector (7).
机译:串联质谱法包括将离解系统(2)紧紧放在离子源(1)之后和磁区(4)之前,并使用能够同时检测到达不同位置到达其检测表面的离子的多通道离子检测器(7)。串联质谱法包括将离解系统(2)紧紧放在离子源(1)之后和磁区(4)之前,并使用能够同时检测到达不同位置到达其检测表面的离子的多通道离子检测器(7)。该方法使用的设备带有真空室,该真空室包含离子轨迹的顺序,离子源(1),离解系统(2),细缝(3),磁扇区(4),细缝( 5),静电分析仪(6)和多通道离子检测器(7)。

著录项

  • 公开/公告号FR2829287A1

    专利类型

  • 公开/公告日2003-03-07

    原文格式PDF

  • 申请/专利权人 SCIGOCKI DAVID;

    申请/专利号FR20010011414

  • 发明设计人 SCIGOCKI DAVID;

    申请日2001-09-04

  • 分类号H01J49/32;G01N27/62;

  • 国家 FR

  • 入库时间 2022-08-21 23:37:53

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号