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Tandem mass spectrometry involves positioning dissociation system after ion source and before magnetic sector and using multichannel ion detector for simultaneously detecting ions reaching its detection surface at different positions
Tandem mass spectrometry involves positioning dissociation system after ion source and before magnetic sector and using multichannel ion detector for simultaneously detecting ions reaching its detection surface at different positions
Tandem mass spectrometry involves positioning a dissociation system (2) immediately after an ion source (1) and before a magnetic sector (4), and using a multichannel ion detector (7) capable of simultaneously detecting ions reaching its detection surface at different positions. Tandem mass spectrometry involves positioning a dissociation system (2) immediately after an ion source (1) and before a magnetic sector (4), and using a multichannel ion detector (7) capable of simultaneously detecting ions reaching its detection surface at different positions. The process uses a device with a vacuum chamber containing in the order of the ion trajectory, an ion source (1), a dissociation system (2), a fine slit (3), a magnetic sector (4), a fine slit (5), an electrostatic analyzer (6) and a multichannel ion detector (7).
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