首页> 外国专利> ELECTROPHOTOGRAPHIC IMAGE FORMING APPARATUS COMPONENT EVALUATION METHOD, EVALUATION DEVICE FOR THE METHOD, ELECTROPHOTOGRAPHIC PHOTORECEPTOR WHOSE SURFACE IS EVALUATED, AND IMAGE FORMING APPARATUS USING THE PHOTORECEPTOR

ELECTROPHOTOGRAPHIC IMAGE FORMING APPARATUS COMPONENT EVALUATION METHOD, EVALUATION DEVICE FOR THE METHOD, ELECTROPHOTOGRAPHIC PHOTORECEPTOR WHOSE SURFACE IS EVALUATED, AND IMAGE FORMING APPARATUS USING THE PHOTORECEPTOR

机译:电子照相成像设备组件评价方法,该方法的评价装置,对电子照相感光体的表面进行了评价,以及使用该感光体的成像设备

摘要

PROBLEM TO BE SOLVED: To provide an evaluation method and an evaluation device for the method, which enable correction of variations in the lighting intensity of an illumination composing an evaluation device, a decrease in the peripheral light quantity of a lens, variations in light quantity caused by an optical system, variations in the sensitivity of a measuring sensor, etc., thereby highly accurately detecting only variations in an object being evaluated.;SOLUTION: In the method for evaluating an electrophotographic image forming apparatus component surface, a component for the electrophotographic image forming apparatus is an object to be evaluated. While the object to be evaluated is rotated, the surface is optically measured by a primary line sensor or a secondary line sensor, thereby creating secondary image data corresponding to the surface of the substrate as an object being evaluated. The secondary multiple resolution of the secondary image data is analyzed to obtain low-frequency component image data and high-frequency component image data. Further, unevenness of the evaluation device which have occurred in the low frequency image data and high frequency image data are corrected to evaluate the surface of the object being evaluated.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种评估方法和该方法的评估装置,其能够校正构成评估装置的照明的照度变化,透镜的周边光量的减少,光量的变化。由光学系统引起的,测量传感器灵敏度的变化等,从而仅能高度准确地检测被评估物体的变化。解决方案:在评估电子照相成像设备部件表面的方法中,电子照相成像设备是要评估的对象。当待评估对象旋转时,通过一次线传感器或二次线传感器对表面进行光学测量,从而生成与作为待评估对象的基板表面相对应的二次图像数据。分析次级图像数据的次级多重分辨率,以获得低频分量图像数据和高频分量图像数据。此外,校正在低频图像数据和高频图像数据中出现的评估装置的不均匀性,以评估被评估物体的表面。版权所有:(C)2004,JPO

著录项

  • 公开/公告号JP2004144859A

    专利类型

  • 公开/公告日2004-05-20

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20020307699

  • 发明设计人 YAMAZAKI JUNICHI;

    申请日2002-10-22

  • 分类号G03G21/00;G01N21/952;G03G5/00;G03G5/10;G03G15/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:34:14

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