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REGRESSION TEST SYSTEM FOR LSI CIRCUIT, DEVICE USED FOR THE SAME AND REGRESSION TEST METHOD

机译:用于LSI电路的回归测试系统,用于该电路的设备和回归测试方法

摘要

PROBLEM TO BE SOLVED: To determine whether a regression test is necessary every time the design of an LSI circuit under verification is changed and execute the test if necessary.;SOLUTION: In a data management device 1, input design data 11 and a test bench 12 are registered in a database 13 while a difference check between already registered data and them is being executed and data corresponding to the contents of the verification are transmitted to a simulation device 2. When a difference exists in the input design data in the difference check, an inquiry whether a regression test is being executed (or reserved) in the simulation device is made. If yes, the regression test is stopped after the acquisition of a user's confirmation. If not or already stopped, the test bench relating to the latest design data is read from the database after the acquisition of the user's confirmation and transmitted in combination with the latest design data to the simulation device.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:每次更改要验证的LSI电路的设计时,确定是否需要进行回归测试,并在必要时执行测试。解决方案:在数据管理设备1中,输入设计数据11和测试台在执行已经登记的数据和它们之间的差异检查的同时,将图12中所示的内容登记在数据库13中,并且将与验证的内容相对应的数据发送到模拟装置2。当在输入设计数据中存在差异检查中的差异时询问在模拟设备中是否正在执行(或保留)回归测试。如果是,则在获取用户确认后停止回归测试。如果尚未获得或已经停止,则在获得用户确认后,从数据库中读取与最新设计数据相关的测试台,并将其与最新设计数据一起传输到仿真设备。版权所有:(C)2004,JPO

著录项

  • 公开/公告号JP2004118443A

    专利类型

  • 公开/公告日2004-04-15

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP20020279644

  • 发明设计人 EMI TAKAO;

    申请日2002-09-25

  • 分类号G06F17/50;H01L21/82;

  • 国家 JP

  • 入库时间 2022-08-21 23:31:58

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