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REGRESSION TEST SYSTEM FOR LSI CIRCUIT, DEVICE USED FOR THE SAME AND REGRESSION TEST METHOD
REGRESSION TEST SYSTEM FOR LSI CIRCUIT, DEVICE USED FOR THE SAME AND REGRESSION TEST METHOD
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机译:用于LSI电路的回归测试系统,用于该电路的设备和回归测试方法
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摘要
PROBLEM TO BE SOLVED: To determine whether a regression test is necessary every time the design of an LSI circuit under verification is changed and execute the test if necessary.;SOLUTION: In a data management device 1, input design data 11 and a test bench 12 are registered in a database 13 while a difference check between already registered data and them is being executed and data corresponding to the contents of the verification are transmitted to a simulation device 2. When a difference exists in the input design data in the difference check, an inquiry whether a regression test is being executed (or reserved) in the simulation device is made. If yes, the regression test is stopped after the acquisition of a user's confirmation. If not or already stopped, the test bench relating to the latest design data is read from the database after the acquisition of the user's confirmation and transmitted in combination with the latest design data to the simulation device.;COPYRIGHT: (C)2004,JPO
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