首页> 外国专利> METHOD FOR FORMING DIGITAL ELEVATION MODEL TO MEASURE TOPOGRAPHIC ELEVATION USING GEOMETRIC CHARACTERISTICS OF INTERFEROMETRIC SYNTHETIC APERTURE RADAR(INSAR)

METHOD FOR FORMING DIGITAL ELEVATION MODEL TO MEASURE TOPOGRAPHIC ELEVATION USING GEOMETRIC CHARACTERISTICS OF INTERFEROMETRIC SYNTHETIC APERTURE RADAR(INSAR)

机译:利用干涉合成孔径雷达(INSAR)的几何特征形成数字高程模型以测量地形高程的方法

摘要

PURPOSE: A method for forming a digital elevation model to measure geometric characteristics of an interferometric synthetic aperture radar(InSAR) is provided to obtain pass difference only due to topographic fringe on the ground of pass difference due to satellite parameters. CONSTITUTION: According to the method, a pass difference from a satellite orbit to a target on the earth is calculated using a repeat pass satellite. A pass difference due to satellite parameters becomes quantitative. A pass difference is calculated using topographic fringe after removing the pass error due to the satellite fringe on the pass difference. An interferometric phase is detected from the pass difference due to topographic fringe. And topographic elevation is obtained from the interferometric phase. Then, the elevation value is processed through multi-look processing or space filtering.
机译:目的:提供一种形成数字高程模型以测量干涉式合成孔径雷达(InSAR)几何特征的方法,以仅获得由于卫星参数引起的通行差基础上的地形条纹而导致的通行差。组成:根据该方法,使用重复通过卫星计算从卫星轨道到地球目标的通过差。由于卫星参数而导致的通过差变得定量。在消除由于通行差上的卫星条纹引起的通行误差之后,使用地形条纹计算通行差。从由于形貌条纹引起的通过差中检测到干涉相。并且从干涉测量阶段获得地形高程。然后,通过多视图处理或空间过滤处理高程值。

著录项

  • 公开/公告号KR100441590B1

    专利类型

  • 公开/公告日2004-07-23

    原文格式PDF

  • 申请/专利权人 CHUNG CHEONG SNG CO. LTD.;

    申请/专利号KR20030024547

  • 发明设计人 LEE JAEK WAN;

    申请日2003-04-18

  • 分类号G09B25/06;

  • 国家 KR

  • 入库时间 2022-08-21 22:46:50

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