首页> 外国专利> Production of a hard mask on a semiconductor substrate used in the production of integrated circuits comprises forming a hard mask layer on the substrate, forming a photolacquer structure on the hard mask layer, and further processing

Production of a hard mask on a semiconductor substrate used in the production of integrated circuits comprises forming a hard mask layer on the substrate, forming a photolacquer structure on the hard mask layer, and further processing

机译:在用于集成电路生产的半导体基板上制造硬掩模包括:在基板上形成硬掩模层;在硬掩模层上形成光漆结构;以及进一步处理

摘要

Production of a hard mask on a semiconductor substrate (1) comprises forming a hard mask layer (2) on the substrate, forming a photolacquer structure on the hard mask layer, inserting a dopant in the hard mask layer in the surface regions of the photolacquer structure, removing the photolacquer structure from the hard mask layer, and etching the hard mask layer using an etchant to open the hard mask layer only in the non-doped regions (31).
机译:在半导体衬底(1)上制造硬掩模包括在衬底上形成硬掩模层(2),在硬掩模层上形成光漆结构,在光掩模的表面区域中在硬掩模层中插入掺杂剂。在该结构中,从硬掩模层去除光漆结构,并使用蚀刻剂蚀刻硬掩模层以仅在非掺杂区域(31)中打开硬掩模层。

著录项

  • 公开/公告号DE10302544A1

    专利类型

  • 公开/公告日2004-08-05

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2003102544

  • 发明设计人 EFFERENN DIRK;MOLL HANS-PETER;

    申请日2003-01-23

  • 分类号H01L21/308;B81C1/00;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:33

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