首页> 外国专利> Determining at least one state parameter of sealing system involves measuring real and/or imaginary parts of complex dielectric function of dielectric element, preferably at frequency above 10-2 Hz

Determining at least one state parameter of sealing system involves measuring real and/or imaginary parts of complex dielectric function of dielectric element, preferably at frequency above 10-2 Hz

机译:确定密封系统的至少一个状态参数涉及测量介电元件的复数介电函数的实部和/或虚部,最好是在10-2 Hz以上的频率下

摘要

The method involves measuring the real and/or imaginary parts of the complex dielectric function of the dielectric element (24), preferably at at least one frequency of greater than 10 -2 Hz. The at least one frequency can lie in the range of 0.1 to 10 MHz, preferably in the range from 100 Hz to 100 kHz. A characteristic frequency profile of the real and/or imaginary part can be determined. An independent claim is also included for the following: (a) a sealing system.
机译:该方法包括测量介电元件(24)的复介电函数的实部和/或虚部,优选地在至少一个大于10-> 2 Hz的频率上。至少一个频率可以在0.1至10MHz的范围内,优选在100Hz至100kHz的范围内。可以确定实部和/或虚部的特征频率曲线。还包括以下方面的独立权利要求:(a)密封系统。

著录项

  • 公开/公告号DE10305110B3

    专利类型

  • 公开/公告日2004-08-19

    原文格式PDF

  • 申请/专利权人 UNIVERSITAET LEIPZIG;

    申请/专利号DE2003105110

  • 发明设计人 KREMER FRIEDRICH;

    申请日2003-02-07

  • 分类号G01M3/28;F16J15/02;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:29

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