首页> 外国专利> X-RAY ATTENUATING MEMBER, X-RAY ATTENUATING METHOD, XAFS (X-RAY ABSORPTION FINE STRUCTURE) EXPERIMENTAL APPARATUS AND XAFS MEASURING METHOD

X-RAY ATTENUATING MEMBER, X-RAY ATTENUATING METHOD, XAFS (X-RAY ABSORPTION FINE STRUCTURE) EXPERIMENTAL APPARATUS AND XAFS MEASURING METHOD

机译:X射线衰减元件,X射线衰减方法,XAFS(X射线吸收精细结构)实验装置和XAFS测量方法

摘要

PROBLEM TO BE SOLVED: To set X-ray intensity within a detection limit (a proportional region) of an X-ray detector without a replacement of the X-ray detector and an output adjustment of an X-ray source.;SOLUTION: The X ray is made to enter at a predetermined location an X-ray attenuating member 10 continuously changing its own thickness in the longitudinal direction L. The X-ray intensity is attenuated at an attenuation rate corresponding to the thickness at the incident location of the X ray in the X-ray attenuating member 10.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:在不更换X射线检测器和不对X射线源进行输出调整的情况下,将X射线强度设置在X射线检测器的检测极限(比例区域)内。使X射线进入预定位置,X射线衰减构件10在纵向L上连续改变其自身厚度。X射线强度以与X的入射位置处的厚度对应的衰减率衰减。射线在X射线衰减部件10中的位置;版权所有:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2004317299A

    专利类型

  • 公开/公告日2004-11-11

    原文格式PDF

  • 申请/专利权人 UNIV TOKYO;

    申请/专利号JP20030111644

  • 发明设计人 ONO KATSUO;OKITSU KOHEI;FUKAWA KAZUHIRO;

    申请日2003-04-16

  • 分类号G01N23/06;

  • 国家 JP

  • 入库时间 2022-08-21 22:36:09

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号