Debugging system, debugging manner of the semiconductor integrated circuit and the semiconductor integrated circuit, being the debugging system which has with the analytical means which analyze the operation of the semiconductor integrated circuit which becomes the substrate for debugging and the target

摘要

PROBLEM TO BE SOLVED: To debug the entire LSI by inexpensive and simple constitution. ;SOLUTION: A plurality of LSIs having the same configuration as that of an LSI 3 which is subjected to debugging are used. Different internal signals are respectively collected from the LSIs under the same operation conditions as that of the LSI 3. The operation of the LSI 3 is analyzed based on the collected internal signals. By doing this, it is not necessary to add output terminals to the LSI or switch the internal signals output from output terminals at periodic time intervals. This facilitates the debugging of the entire LSI in a low-cost.;COPYRIGHT: (C)2003,JPO