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Fluorescent magnetic particle testing method and fluorescent magnetic particle flaw detector

机译:荧光磁粉探伤方法及荧光磁粉探伤仪

摘要

And in which it is possible to obtain an image of the clear bright fluorescent magnetic particle pattern, eliminating a complicated mechanism, to provide a fluorescent magnetic particle device with excellent maintainability and low cost, the fluorescent magnetic particle device, a light source 26 of the ultraviolet irradiation device 25 CCD camera by adding a video signal multiplying function and functions to open the shutter light-emitting time of the strobe light, and has a band-pass filter 32 as a strobe light, and transmits only the spectral band of the fluorescence to the front of the imaging device 30 I have a. Thus, a clear fluorescent magnetic particle pattern can be obtained and faster relative speed between the inspection device and the material to be inspected has become possible.
机译:并且,能够获得清晰明亮的荧光磁性粒子图案的图像,而无需复杂的机构,从而能够提供维护性优异且成本低的荧光磁性粒子装置,荧光磁性粒子装置,光源26,紫外线照射装置25 CCD照相机通过附加视频信号倍增功能而具有打开闪光灯的快门发光时间的功能,并具有作为闪光灯的带通滤波器32,仅使荧光的光谱带透过到成像设备30的前面我有一个。因此,可以获得清晰的荧光磁性粒子图案,并且检查装置与被检查材料之间的相对速度变得更快。

著录项

  • 公开/公告号JPWO2003071256A1

    专利类型

  • 公开/公告日2005-06-16

    原文格式PDF

  • 申请/专利权人 新日本製鐵株式会社;

    申请/专利号JP20030570110

  • 发明设计人 松田 秀樹;國永 学;内藤 修治;

    申请日2003-02-17

  • 分类号G01N21/91;G01B11/30;G01N27/84;

  • 国家 JP

  • 入库时间 2022-08-21 22:26:49

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