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Apparatus and method for inspecting interface between ground layer and substrate of microstrip by using scattering parameters
Apparatus and method for inspecting interface between ground layer and substrate of microstrip by using scattering parameters
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机译:利用散射参数检查微带接地层与衬底之间界面的装置和方法
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摘要
An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined range of frequencies; a detecting unit for detecting scattering parameters of an output signal from the microstrip in response to the frequency of the signal; and an analyzing unit for analyzing the interface based on the scattering parameters.
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