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Dynamic, Non-invasive detection of hot-pluggable problem components and re-active re-allocation of system resources from problem components
Dynamic, Non-invasive detection of hot-pluggable problem components and re-active re-allocation of system resources from problem components
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机译:动态,非侵入式地检测可热插拔的问题组件,并从问题组件中重新主动重新分配系统资源
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摘要
A method, system, and data processing system for dynamic detection of problem components in a hot-plug processing system and automatic removal of the problem component via hot-removal methods without disrupting processing of the overall system. A data processing system that provides a non-disruptive, hot-plug functionality is designed with a additional logic for initiating and/or completing a sequence of factory level tests on hot-pluggable components to determine if the component if functioning properly. When a component is not functioning properly, the OS re-allocates the workload of the component to other component so the system, and when the OS completes the re-allocation, the service element initiates the hot removal of the component so that the component is logically and electrically separated from the system.
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