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Imaging device calibration methods, imaging device calibration instruments, imaging devices, and articles of manufacture

机译:成像设备校准方法,成像设备校准仪器,成像设备和制造产品

摘要

Imaging device calibration methods, imaging device calibration instruments, imaging devices, and articles of manufacture are described. According to one embodiment, an imaging device calibration method includes emitting light for use in calibration of an imaging device, providing an emission characteristic of the light, sensing the light using an image sensor of the imaging device, generating sensor data indicative of the sensing using the image sensor, and determining at least one optical characteristic of the imaging device using the generated sensor data and the emission characteristic for use in calibration of the imaging device, and wherein the at least one optical characteristic corresponds to the image device used to sense the light.
机译:描述了成像设备校准方法,成像设备校准仪器,成像设备和制造物品。根据一个实施例,一种成像装置校准方法包括:发射用于成像装置的校准的光;提供光的发射特性;使用成像装置的图像传感器来感测光;使用传感器来生成指示感测的传感器数据。所述图像传感器,并使用所生成的传感器数据和发射特性来确定所述成像设备的至少一个光学特性,以用于所述成像设备的校准,并且其中,所述至少一个光学特性对应于用于感测所述图像传感器的图像设备。光。

著录项

  • 公开/公告号US2005219364A1

    专利类型

  • 公开/公告日2005-10-06

    原文格式PDF

  • 申请/专利权人 JEFFREY M. DICARLO;

    申请/专利号US20040818622

  • 发明设计人 JEFFREY M. DICARLO;

    申请日2004-04-05

  • 分类号G01T1/164;

  • 国家 US

  • 入库时间 2022-08-21 22:22:39

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