首页> 外国专利> Twin-mask lithography for a substrate surface coated with a photo varnish, to form an electronic integrated circuit, has light shrouding main and auxiliary structures which are used with illumination

Twin-mask lithography for a substrate surface coated with a photo varnish, to form an electronic integrated circuit, has light shrouding main and auxiliary structures which are used with illumination

机译:用于涂覆有光油的基板表面的双掩模光刻技术,形成一个电子集成电路,具有遮光的主辅结构,用于照明

摘要

A twin-mask process is used to structure a substrate surface with a photo varnish coating by lithography, for an integrated electronic circuit. The coating is illuminated using the first mask with a light shrouding main structure (2) and an auxiliary structure (3). The main structure is formed on the varnish, with the auxiliary structure used to support the accuracy of the image. The varnish is again illuminated with the second mask with transparent zones (4), to form further structures on the varnish, without light falling on the main structure. The structures are positioned with given gaps (A,B,D) between them.
机译:双掩膜工艺用于通过光刻将具有光清漆涂层的基板表面结构化,用于集成电路。使用具有遮光罩的主结构(2)和辅助结构(3)的第一掩模对涂层进行照明。主要结构形成在清漆上,辅助结构用于支持图像的准确性。再次用具有透明区域(4)的第二掩模照射清漆,以在清漆上形成其他结构,而没有光落在主体结构上。将结构放置在它们之间具有给定间隙(A,B,D)的位置。

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