首页> 外国专利> one -, two - and three-dimensional massverk amp; all; rperungen physical gr amp; all; amp; w; e, l amp; auml; nge with combined optical and tactile antastbaren messfl amp; auml; chen, with systematic ma amp; white; reference of both antastverfahren

one -, two - and three-dimensional massverk amp; all; rperungen physical gr amp; all; amp; w; e, l amp; auml; nge with combined optical and tactile antastbaren messfl amp; auml; chen, with systematic ma amp; white; reference of both antastverfahren

机译:一维,二维和三维Massverk以及所有; rperungen物理gr&all; &w; e,lä nge结合了光学和触觉式的antastbaren messflä陈,有系统的黑白antastverfahren的参考

摘要

a,two - and three-dimensional massverk & all; rperungen physicalgr & all; & w; e l & auml; nge with combinedvisual and tactile antastbaren messfl & auml; chen, with systematic ma & white; relation of bothantastverfahren, marked by the fact that they visually - tactileabtastbare messfl & auml; chenas with a oberfl & auml chenstruktur homogeneous;command, halbkugelf & all; rmigerpitting and surveys in the range of (depending on the manufacturing process)a few nanometers to about 50 micrometers and are fitted.
机译:一种,二维和三维massverk物理性gr&all; &w; e lä结合视觉和触觉性的antastbaren messflä陈,有系统的黑白两者的关系antastverfahren,其特征在于视觉上-触觉令人震惊的消息陈与oberfl和auml chenstruktur同质;命令,halbkugelf和所有;移民点蚀和检验范围(取决于制造过程)数纳米到约50微米并安装。

著录项

  • 公开/公告号DE202004007653U1

    专利类型

  • 公开/公告日2004-11-25

    原文格式PDF

  • 申请/专利号DE202004007653

  • 发明设计人

    申请日2004-05-10

  • 分类号G01B21/02;G01B11/02;G01B5/02;

  • 国家 DE

  • 入库时间 2022-08-21 22:00:34

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