首页> 外国专利> Light signal measuring process, involves analyzing short pulse train, and applying inverse relation of deterministic relation of temporal wave form of each pulse to samples for measuring temporal waveform of light signal

Light signal measuring process, involves analyzing short pulse train, and applying inverse relation of deterministic relation of temporal wave form of each pulse to samples for measuring temporal waveform of light signal

机译:光信号的测量过程包括分析短脉冲串,并将每个脉冲的时间波形的确定关系的逆关系应用于样本,以测量光信号的时间波形

摘要

The process involves generating a short pulse train (14) with high frequency. The temporal wave form of each pulse has a deterministic relation with the temporal wave form of any received light signal (13). The train is analyzed by a process of rapid ultra electro-optical sampling of periodic pulse. An inverse relation of the deterministic relation is applied to samples to measure temporal waveform of the signal. An independent claim is also included for a device for measuring any received light signal.
机译:该过程涉及产生具有高频的短脉冲串(14)。每个脉冲的时间波形与任何接收到的光信号(13)的时间波形具有确定的关系。通过对周期脉冲进行快速超光电采样的过程来分析列车。确定性关系的逆关系应用于样本以测量信号的时间波形。还包括用于测量任何接收到的光信号的设备的独立权利要求。

著录项

  • 公开/公告号FR2860120A1

    专利类型

  • 公开/公告日2005-03-25

    原文格式PDF

  • 申请/专利权人 METIVIER PHILIPPE;

    申请/专利号FR20030050594

  • 发明设计人 METIVIER PHILIPPE;YVERNAULT PHILIPPE;

    申请日2003-09-23

  • 分类号H04N5/44;H04B10/00;

  • 国家 FR

  • 入库时间 2022-08-21 21:58:21

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