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Noise figure-measuring device and noise figure-measuring method

机译:噪声系数测量装置和噪声系数测量方法

摘要

Output light spectrum P2(. g. ) data from an optical amplifier and input light spectrum P1(. g. ) data of signal light are prepared, the difference between the P2(. g. ) and a value obtained by multiplying the P1(. g. ) by a provisional gain GT is determined (Steps S232), for the obtained spectrum data, a noise removing process such as a moving average process and the like is performed and then, a spline interpolation process is also performed, whereby ASE light spectrum P3(. g. ) data is prepared and an ASE light level P ASE is determined (Steps S233 through S235). In addition, a noise figure-measuring device 10 calculates the number of channels of WDM light and signal light wavelengths of the respective channels based on the P1(. g. ) or P2(. g. ), and performs analysis to calculate a noise figure NF and the like of an appointed wavelength range around the center of each wavelength thus calculated.
机译:准备来自光放大器的输出光谱P2(.g。)数据和信号光的输入光谱P1(.g。)数据,P2(.g。)与通过将P1(通过临时增益GT来确定(例如,)(步骤S232),对于获得的频谱数据,执行诸如移动平均处理等的噪声去除处理,然后,还执行样条插值处理,从而ASE准备光谱P3(g)数据,并确定ASE光水平P ASE(步骤S233至S235)。另外,噪声系数测量装置10基于P1(g)或P2(g)计算WDM光的通道数和各个通道的信号光波长,并进行分析以计算噪声。这样计算出的每个波长的中心附近的指定波长范围的图NF等。

著录项

  • 公开/公告号GB2373854B

    专利类型

  • 公开/公告日2005-04-06

    原文格式PDF

  • 申请/专利权人 * ANDO ELECTRIC CO. LTD.;

    申请/专利号GB20010028511

  • 发明设计人 GENTARO * ISHIHARA;TOHRU * MORI;

    申请日2001-11-28

  • 分类号H04B10/08;

  • 国家 GB

  • 入库时间 2022-08-21 21:57:44

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