JITTER ANALYSIS METHOD, JITTER ANALYSIS APPARATUS AND JITTER ANALYSIS PROGRAM

摘要

PPROBLEM TO BE SOLVED: To provide a method, apparatus, and program for integrally analyzing in real time both generation of power source noises and jitters due to the noises with respect to an external output signal of an LSI. PSOLUTION: From LSI layout design data 601, resistance, capacitance and inductance of power source wiring are extracted and a power source LRC model 606 is created. An analysis model creating means 812 connects the power source LRC model 606, a transistor circuit model 610, a noise source model 607, a silicon substrate model 608, a static power capacitance model 609, and a package/board model 611 so as to create a power source noise analysis model 813 and a jitters analysis model 817. An analysis execution means 814 obtains power source noise waveform data 816 in a first simulation, uses the power source noise waveform data 816 in the second simulation so as to obtain jitters analysis data 815. PCOPYRIGHT: (C)2006,JPO&NCIPI