Method and device for determining microstructural parameters of thin porous layers

摘要

the invention concerns a method for determination of mikrostrukturparametern for a thin porous layer, in which a gas through the porous layer (4) is conducted, and the flow of gas through the porous layer is measured. the first porous layer on a gasundurchlu00e4ssigen carrier (8) is arranged.during the measurement of the gas through the porous layer so (4) guided, the entry of the gas in the porous layer and the leakage of the gas from the porous layer, at least in part, on the same side of the porous layer is made, the institution of facing.;the invention concerns also the following device.it has a medium to which a first and a second part of the probenhalters so one can achieve that the second part of the probenhalters a dichtelement (5) on a first part of the probenhalters, porous layer fixing ability.in the fixation of the dichtelements on the porous layer (4), the free surface of the porous layer adjacent, closed gasru00e4ume (1.2).