首页> 外国专利> Selective erase method for NOR-type flash memory used in e.g. computer, involves identifying memory cells having threshold voltage lower than desired erase threshold voltage, after performing erase operation on group of memory cells

Selective erase method for NOR-type flash memory used in e.g. computer, involves identifying memory cells having threshold voltage lower than desired erase threshold voltage, after performing erase operation on group of memory cells

机译:例如在NOR中使用的NOR型闪存的选择性擦除方法计算机,涉及在对一组存储单元执行擦除操作之后,识别具有低于期望的擦除阈值电压的阈值电压的存储单元

摘要

An erase operation is performed on a group of memory cells, and one or more rows of memory cells having a threshold voltage lower than a desired erase threshold voltage, are identified. A further erase operation is performed on the memory cells excluding the identified row or rows of memory cells.
机译:在一组存储单元上执行擦除操作,并且识别阈值电压低于期望的擦除阈值电压的一行或多行存储单元。在除所标识的存储单元的行之外的存储单元上执行进一步的擦除操作。

著录项

  • 公开/公告号DE102005035077A1

    专利类型

  • 公开/公告日2006-02-16

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号DE20051035077

  • 发明设计人 KWON WOOK-HYUN;HAN JUNG-IN;

    申请日2005-07-21

  • 分类号G11C16/16;G11C16/14;G11C16/22;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:15

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