首页> 外国专利> High voltage generating method for non-volatile memory, involves ramping voltage in response to another ramping voltage, where former ramping voltage has ramping speed slower than another ramping speed

High voltage generating method for non-volatile memory, involves ramping voltage in response to another ramping voltage, where former ramping voltage has ramping speed slower than another ramping speed

机译:用于非易失性存储器的高电压产生方法,涉及响应于另一种斜坡电压来斜坡电压,其中前一种斜坡电压的斜坡速度比另一种斜坡速度慢

摘要

The method involves generating an initial voltage having a voltage ramping speed. A ramping voltage is generated in response to the initial voltage. The ramping voltage has another ramping speed slower than the previous ramping speed. Another ramping voltage is generated in response to the former ramping voltage, where the latter ramping voltage has a third ramping speed slower than the latter ramping speed. An independent claim is also included for a non-volatile memory device comprising a high voltage generating circuit.
机译:该方法包括产生具有电压斜坡速度的初始电压。响应于初始电压而产生斜坡电压。斜坡电压的另一个斜坡速度比以前的斜坡速度慢。响应于前者的斜坡电压而产生另一斜坡电压,其中后者的斜坡电压具有比后者的斜坡速度慢的第三斜坡速度。对于包括高压产生电路的非易失性存储装置也包括独立权利要求。

著录项

  • 公开/公告号DE102005062521A1

    专利类型

  • 公开/公告日2006-09-14

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号DE20051062521

  • 发明设计人 CHAE DONG-HYUK;LIM YOUNG HO;

    申请日2005-12-19

  • 分类号G11C16/12;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:11

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号