首页> 外国专利> Laser scanning unit, has linear lens to revise time-dependent, sinusoidal angular deviation of microelectromechanically pivotable reflector and to scan laser beam from image plane, where reflector has harmonic movement in pivoting region

Laser scanning unit, has linear lens to revise time-dependent, sinusoidal angular deviation of microelectromechanically pivotable reflector and to scan laser beam from image plane, where reflector has harmonic movement in pivoting region

机译:激光扫描单元,具有线性透镜,可修正微机电枢转反射器随时间变化的正弦角偏差,并扫描来自像平面的激光束,其中反射器在枢转区域中具有谐波运动

摘要

The unit has a collimating lens (11) to output a parallel laser beam upon receiving the laser beam from a semiconductor laser (10). The parallel beam falls on a microelectromechanically pivotable reflector (12) which exhibits a harmonic movement in a pivoting region by a MEMS pivotable mechanism. A linear F-Sintheta lens revises the time-dependent, sinusoidal angular deviation of the reflector and scans the laser beam from an image plane.
机译:该单元具有准直透镜(11),以在接收到来自半导体激光器(10)的激光束时输出平行的激光束。平行光束落在微机电可枢转的反射器(12)上,该微机电可枢转的反射器(12)通过MEMS可枢转机构在枢转区域中表现出谐波运动。线性F-Sintheta透镜可修正反射器随时间变化的正弦角偏差,并从像平面扫描激光束。

著录项

  • 公开/公告号DE202006004685U1

    专利类型

  • 公开/公告日2006-05-18

    原文格式PDF

  • 申请/专利权人 E-PIN OPTICAL INDUSTRY CO. LTD.;

    申请/专利号DE20062004685U

  • 发明设计人

    申请日2006-03-23

  • 分类号G02B26/10;G03G15/04;

  • 国家 DE

  • 入库时间 2022-08-21 21:19:44

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