首页> 外国专利> METHOD FOR IDENTIFYING TROUBLE IN MEASURING TOOL USED FOR MEASURING DESIRED DIMENSIONS IN MICROELECTRONIC MECHANISM, METHOD FOR IDENTIFYING TROUBLE IN MEASURING TOOL SYSTEM USED FOR MEASURING DESIRED DIMENSIONS, AND COMPUTER PROGRAM (MEASURING TOOL ERROR LOG ANALYSIS METHOD AND SYSTEM) FOR IDENTIFYING TROUBLE IN MEASURING TOOL SYSTEM

METHOD FOR IDENTIFYING TROUBLE IN MEASURING TOOL USED FOR MEASURING DESIRED DIMENSIONS IN MICROELECTRONIC MECHANISM, METHOD FOR IDENTIFYING TROUBLE IN MEASURING TOOL SYSTEM USED FOR MEASURING DESIRED DIMENSIONS, AND COMPUTER PROGRAM (MEASURING TOOL ERROR LOG ANALYSIS METHOD AND SYSTEM) FOR IDENTIFYING TROUBLE IN MEASURING TOOL SYSTEM

机译:用于确定微电子机构中所需尺寸的测量工具中的故障的方法,用于确定所需尺寸的测量工具系统中的故障的确定方法,用于测量故障日志的方法(系统中测量工具错误的系统)

摘要

PPROBLEM TO BE SOLVED: To provide a method for identifying the trouble of a measuring tool system used for measuring the desired dimensions of a microelectronic mechanism. PSOLUTION: Each measuring tool of the system executes a plurality of recipes for measuring the desired dimensions of the microelectronic mechanism, and each recipe includes a series of commands for measuring at least one dimension of the microelectronic mechanism. The system includes an error log for storing trouble when measuring the dimensions of the microelectronic mechanism. The method includes a process for determining a normalized number of errors from the trouble stored in the error log to a recipe used for the measuring tool; a process for identifying at least one recipe having a maximum number of normalized errors in the error log; a process for identifying at least one identified recipe having a maximum number of normalized errors by a job list to be executed by the measuring tool; and a process for determining the cause of the error of at least one recipe from at least one identified recipe having a maximum number of normalized errors. PCOPYRIGHT: (C)2007,JPO&INPIT
机译:

要解决的问题:提供一种识别用于测量微电子机构的期望尺寸的测量工具系统的故障的方法。解决方案:系统的每个测量工具执行多个用于测量微电子机构所需尺寸的配方,并且每个配方都包括一系列命令,用于测量微电子机构的至少一个尺寸。该系统包括一个错误日志,用于在测量微电子机构的尺寸时存储故障。该方法包括以下过程:确定从错误日志中存储的故障到用于测量工具的配方的错误的标准化数量;一种用于在错误日志中识别至少一个具有最大标准化错误数的配方的过程;一种用于通过要由测量工具执行的作业列表来识别至少一个具有最大标准化错误数的已识别配方的过程;以及一种用于从至少一个识别出的具有最大数量的标准化错误的配方中确定至少一个配方的错误原因的过程。

版权:(C)2007,日本特许厅&INPIT

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