首页> 外国专利> SAMPLE FOR ORIENTATION STATE EVALUATION, MANUFACTURING METHOD OF THE SAMPLE FOR ORIENTATION STATE EVALUATION, AND ORIENTATION STATE EVALUATION METHOD

SAMPLE FOR ORIENTATION STATE EVALUATION, MANUFACTURING METHOD OF THE SAMPLE FOR ORIENTATION STATE EVALUATION, AND ORIENTATION STATE EVALUATION METHOD

机译:取向状态评价用样品,取向状态评价用样品的制造方法以及取向状态评价方法

摘要

PROBLEM TO BE SOLVED: To provide a method for measuring a fine domain smaller than the spot diameter of excitation light, by solving the problem, wherein the fine domain smaller than the spot diameter of excitation light cannot be measured in a method wherein a light-emitting polymer film reflecting the orientation state of a bedding orientation film is formed by applying a light-emitting polymer onto the sample whole surface and applying heating treatment as a means to examine orientation of the orientation film for a liquid crystal, and the orientation state is measured by measuring fluorescence generated, by irradiating the light-emitting polymer film with the excitation light.;SOLUTION: The light-emitting polymer film is formed into an island shape, and this island is arranged at intervals larger than the spot diameter of the excitation light. Consequently, when the excitation light is irradiated, only the spot parts having the island shape emits fluorescence. The region, smaller than the spot diameter of the excitation light, can be analyzed by setting the island size to be smaller than the spot diameter of the excitation light.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:通过解决以下问题,提供一种用于测量小于激发光的光斑直径的精细区域的方法,其中小于激发光的光斑直径的精细区域不能通过以下方法测量:通过在样品的整个表面上施加发光聚合物并进行加热处理作为检查液晶取向膜的取向的手段,形成反映出取向取向膜的取向状态的发光聚合物膜。通过用激发光照射发光聚合物膜来测量通过测量产生的荧光来进行测量;解决方案:发光聚合物膜形成为岛形,并且该岛的间隔大于激发光斑的直径光。因此,当照射激发光时,仅具有岛状的斑点部分发射荧光。可以通过将岛尺寸设置为小于激发光的光斑直径来分析小于激发光的光斑直径的区域。COPYRIGHT:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007212269A

    专利类型

  • 公开/公告日2007-08-23

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20060031992

  • 发明设计人 HIRAIWA TAKU;

    申请日2006-02-09

  • 分类号G01N21/64;G01M11/00;G02F1/13;G02F1/1337;

  • 国家 JP

  • 入库时间 2022-08-21 21:15:02

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号