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Residual stress data measurement method and a residual stress measurement method using the residual stress measurement apparatus, and computer-readable recording medium recording the residual stress measurement program

机译:残余应力数据测量方法和使用残余应力测量设备的残余应力测量方法,以及记录残余应力测量程序的计算机可读记录介质

摘要

Disclosed herein is an apparatus for measuring residual stress, methods of measuring residual stress data and residual stress using the apparatus, and a recording medium for storing software of the residual stress measuring method. The present invention is advantageous for evaluation of a mechanical material property and is non-destructive. Further, the present invention is widely applied to fields ranging from a microscopic area, such as a thin film or micro device, to a large-sized structure, and is not influenced by a microstructure by controlling the range of an applied load. Further, the measuring apparatus of the present invention is minimized in its volume to be easily attached to an actual structure. Further, in the present invention, various attaching devices are employed, thus enabling the apparatus to be attached to various materials regardless of the size and type of object materials to measure residual stress. Further, the measuring apparatus of the present invention is horizontally movable, so there is no need to move an apparatus body itself so as to take measurements at several positions of several materials. Further, the present invention does not require separate measurements for correcting experimental constants at the time of analyzing measured data.
机译:本文公开了一种用于测量残余应力的设备,使用该设备测量残余应力数据和残余应力的方法以及用于存储残余应力测量方法的软件的记录介质。本发明对于机械材料性能的评估是有利的,并且是非破坏性的。此外,本发明广泛地应用于从诸如薄膜或微器件的微观区域到大型结构的领域,并且通过控制施加的载荷的范围不受微观结构的影响。此外,本发明的测量设备的体积被最小化以易于附接到实际结构上。此外,在本发明中,采用了各种附接装置,从而使得该装置能够附接到各种材料,而与测量残余应力的目标材料的尺寸和类型无关。此外,本发明的测量设备可水平移动,因此不需要移动设备主体本身以便在几种材料的多个位置进行测量。此外,本发明在分析测量数据时不需要用于校正实验常数的单独测量。

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