Specific pattern recognition device specific pattern recognition method, specific pattern recognition programs, and specific pattern recognition program recording medium

摘要

PPROBLEM TO BE SOLVED: To perform a robust recognition hardly influenced by environment fluctuation such as illumination fluctuation, obstacles and positioning errors. PSOLUTION: A processing device 15 is provided with a model generation part 151, a partial pattern candidate point extracting part 152, a model deformation part 152, and a similarity evaluating part 154. The whole pattern of a recognition target image is divided into a partial pattern of a characteristic part and a connection pattern of other parts, and a part similar to the partial pattern is detected from a digital image including the recognition target image. The deformation of the whole pattern (position, rotation, and scale fluctuation) is estimated based on the information of the part, and deformation of the whole pattern estimated with the usage of the information of the whole pattern is inspected whether it is accurate or not. Thus, the whole pattern can be recognized. PCOPYRIGHT: (C)2003,JPO