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In the playback methodological null photoresist exfoliation process control method of photoresist exfoliation process control method and the photoresist

机译:在回放方法中,空光刻胶剥离工艺的控制方法为光刻胶剥离工艺的控制方法和光刻胶

摘要

Although photoresist layer is exfoliated in the method of controlling the photoresist exfoliation process in order to produce the semiconductor device or the Liquid Crystal Display element, constitution of the exfoliation liquid which is used it is analyzed first making use of the NIR spectroscope. State of the exfoliation liquid is judged by comparing constitution and the standard constitution which were analyzed. When life of the exfoliation liquid ends the aforementioned exfoliation liquid is exchanged in the new exfoliation liquid, so the aforementioned exfoliation liquid is transported to the next photoresist exfoliation process when is not. This analysis technology resemblance at system can be applied to photoresist exfoliation liquid playback process. Selective figure Figure 1
机译:为了制造半导体装置或液晶显示元件,在控制光致抗蚀剂剥离工序的方法中使光致抗蚀剂层剥离,但首先使用NIR分光镜分析所使用的剥离液的构成。通过比较所分析的成分和标准成分来判断剥离液的状态。当剥离液的寿命结束时,在新的剥离液中交换上述剥离液,因此在没有剥离时将上述剥离液输送到下一个光致抗蚀剂剥离工序。这种与系统相似的分析技术可以应用于光致抗蚀剂剥离液的回放过程。<选择图>图1

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