首页> 外国专利> Determining radiological thickness of object involves determining geometrical object thickness for defined through radiation direction from model measurement data, determining radiological thickness using at least one absorption parameter

Determining radiological thickness of object involves determining geometrical object thickness for defined through radiation direction from model measurement data, determining radiological thickness using at least one absorption parameter

机译:确定物体的放射线厚度涉及从模型测量数据确定要通过辐射方向定义的几何物体的厚度,使用至少一个吸收参数确定放射线厚度

摘要

The method involves multidimensional optical measurement of the object (5), generation of a virtual 3-dimensional measurement model from the measurement data, determining a geometrical object thickness for a defined through radiation direction from the model measurement data, determining the radiological thickness using at least one absorption parameter, setting operating parameters of an X-radiation source depending on the radiological thickness, through radiating the object in the through radiation direction with an X-ray dose defined by the parameter settings.
机译:该方法包括对物体进行多维光学测量(5),从测量数据生成虚拟3维测量模型,从模型测量数据确定通过辐射方向定义的几何物体厚度,使用至少一个吸收参数,通过利用由所述参数设置定义的X射线剂量沿所述穿透辐射方向辐射所述物体,来根据放射线厚度来设置X射线源的工作参数。

著录项

  • 公开/公告号DE102005028415A1

    专利类型

  • 公开/公告日2006-12-21

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20051028415

  • 申请日2005-06-20

  • 分类号A61B6/03;G01N29/06;A61B6/10;H05G1/42;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:55

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