首页> 外国专利> Production process for an n or p emitter layer in a semiconductor body of a high power component and such a layer deposits and dopes an amorphous silicon layer and heats to three hundred to four hundred degrees

Production process for an n or p emitter layer in a semiconductor body of a high power component and such a layer deposits and dopes an amorphous silicon layer and heats to three hundred to four hundred degrees

机译:用于高功率组件的半导体主体中的n或p发射极层的制造工艺,并且该层沉积并掺杂非晶硅层,并加热到三百到四百度

摘要

A production process for an n- or p-emitter layer in a semiconductor body of a power or high-power component comprises depositing an amorphous silicon layer on a crystalline substrate, doping the silicon and heating to 300-400[deg] C. Preferably the doping is by depositing a metal layer on the silicon of by ion-implantation and the metal is preferably aluminum. An independent claim is also included for a p-emitter layer as above for an IGBT.
机译:用于功率或高功率组件的半导体主体中的n或p发射极层的生产工艺包括在结晶衬底上沉积非晶硅层,掺杂硅并加热到300-400℃。掺杂是通过离子注入在硅上沉积金属层,并且金属优选是铝。如上针对IGBT的p发射极层也包括独立权利要求。

著录项

  • 公开/公告号DE102005035648A1

    专利类型

  • 公开/公告日2007-02-15

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AUSTRIA AG;

    申请/专利号DE20051035648

  • 发明设计人 DIEZ MICHAEL;RUPP THOMAS;

    申请日2005-07-29

  • 分类号H01L21/331;H01L29/739;H01L21/20;H01L21/265;H01L21/324;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:49

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