首页> 外国专利> Component`s defect inspecting method for , involves evaluating medium-run time between transducer and surface, and determining medium-run time and defect localization using transmitting condition and receiving condition

Component`s defect inspecting method for , involves evaluating medium-run time between transducer and surface, and determining medium-run time and defect localization using transmitting condition and receiving condition

机译:组件的缺陷检查方法,涉及评估换能器与表面之间的介质运行时间,并使用发送条件和接收条件确定介质运行时间和缺陷定位

摘要

The method involves radiating a surface (4) of a component (2) by a liquid/gaseous flow medium (3) with an ultrasound radiation that is produced by a transmitting/receiving transducer (6). A part of the radiation is reflected back at the surface to the transducer, and return-sound radiation is received by the transducer. Medium-run time is evaluated between the transducer and the surface. The evaluated time is considered with a localization of a defect (5) within the component. Transmitting condition and receiving condition are used for determining the medium-run time and defect localization. An independent claim is also included for an arrangement for inspecting a defect of a component.
机译:该方法包括利用由发射/接收换能器(6)产生的超声波辐射通过液体/气体流动介质(3)辐射部件(2)的表面(4)。辐射的一部分在表面反射回换能器,回声辐射被换能器接收。在换能器和表面之间评估介质运行时间。考虑到评估的时间并确定了组件内缺陷(5)的位置。发送条件和接收条件用于确定介质运行时间和缺陷定位。还包括用于检查部件缺陷的装置的独立权利要求。

著录项

  • 公开/公告号DE102005047536B3

    专利类型

  • 公开/公告日2007-04-05

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20051047536

  • 发明设计人 MOOSHOFER HUBERT;

    申请日2005-09-30

  • 分类号G01N29/07;G01N29/28;G01N29/38;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:42

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