首页> 外国专利> Spatial representation method for area of investigation object, involves adjusting X-ray depending on area to be examined, so that beam limiting surface encloses examined area

Spatial representation method for area of investigation object, involves adjusting X-ray depending on area to be examined, so that beam limiting surface encloses examined area

机译:用于调查对象区域的空间表示方法,包括根据要检查的区域调整X射线,以使光束限制表面包围被检查的区域

摘要

The method involves determining multiple two-dimensional projection data records, identified by per projection direction. A projection data record is obtained from an X-ray (X) penetrating the investigation object (U), which has an abrasive medium axle (Sx) extended in projection direction, and is limited by a beam limiting surface. The X-ray is so adjusted depending on the area, which is to be examined, so that the beam limiting surface encloses the area (B), which is to be examined. An independent claim is also included for a device for spatial representation of an area to be examined, of an investigation object, which has an X-ray emitter for generating X-ray.
机译:该方法涉及确定由每个投影方向标识的多个二维投影数据记录。投影数据记录是从穿透检查对象(U)的X射线(X)获得的,X射线具有在投影方向上延伸并受光束限制表面限制的磨料轴(Sx)。根据要检查的区域来调节X射线,以使光束限制表面包围要检查的区域(B)。还包括一种独立权利要求,其用于对研究对象的待检查区域进行空间表示的装置,该装置具有用于产生X射线的X射线发射器。

著录项

  • 公开/公告号DE102006006041A1

    专利类型

  • 公开/公告日2007-08-23

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20061006041

  • 发明设计人 PFISTER MARCUS;BOESE JAN;

    申请日2006-02-09

  • 分类号A61B6/02;A61B6/06;G06T17/00;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:24

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