首页> 外国专利> Small angle scattering measuring device for analysis of nanostructure of sample, has channel formed by sections that are lowered in gap of optical bank inside of frame, where frame has guide for balancing trigonometric length variation

Small angle scattering measuring device for analysis of nanostructure of sample, has channel formed by sections that are lowered in gap of optical bank inside of frame, where frame has guide for balancing trigonometric length variation

机译:用于分析样品纳米结构的小角度散射测量装置,其通道由降低了框架内部光学银行间隙的部分形成,其中框架具有用于平衡三角长度变化的导向装置

摘要

The device has a vacuum-sealed channel formed by metal bellow sections (13), where one of the sections is connected with the rest sections in a detachable manner by using a double-sided flange (16). An intermediate ring (14) has supports that are provided with guides, which surround auxiliary rails that are arranged on a subframe. The sections are lowered in a gap of an optical bank (1) inside of a frame (2), where the frame opposite to a base frame is equipped with a linear guide for balancing trigonometric length variation.
机译:该装置具有由金属波纹管部分(13)形成的真空密封通道,其中该部分中的一个通过使用双面凸缘(16)以可拆卸的方式与其余部分连接。中间环(14)具有带有引导件的支撑件,所述引导件围绕布置在副车架上的辅助轨道。将这些部分降低到框架(2)内侧的光学隔堤(1)的间隙中,其中与基础框架相对的框架配有用于平衡三角长度变化的线性导轨。

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