首页>
外国专利>
Small angle scattering measuring device for analysis of nanostructure of sample, has channel formed by sections that are lowered in gap of optical bank inside of frame, where frame has guide for balancing trigonometric length variation
Small angle scattering measuring device for analysis of nanostructure of sample, has channel formed by sections that are lowered in gap of optical bank inside of frame, where frame has guide for balancing trigonometric length variation
The device has a vacuum-sealed channel formed by metal bellow sections (13), where one of the sections is connected with the rest sections in a detachable manner by using a double-sided flange (16). An intermediate ring (14) has supports that are provided with guides, which surround auxiliary rails that are arranged on a subframe. The sections are lowered in a gap of an optical bank (1) inside of a frame (2), where the frame opposite to a base frame is equipped with a linear guide for balancing trigonometric length variation.
展开▼