首页> 外国专利> Sub-micrometric suspended object, e.g. tension bar, manufacturing method for fabricating, e.g., chip, involves etching assembly formed by masks, transfer and recess layers to hollow out recess layer part so that objects are suspended

Sub-micrometric suspended object, e.g. tension bar, manufacturing method for fabricating, e.g., chip, involves etching assembly formed by masks, transfer and recess layers to hollow out recess layer part so that objects are suspended

机译:亚微米级悬浮物,例如张力杆,用于制造例如芯片的制造方法,包括将由掩模,转印层和凹陷层形成的蚀刻组件蚀刻到凹陷的凹陷层部分,从而使物体悬浮

摘要

The method involves producing sub-micrometric objects (38) on a transfer layer and making hard masks on a part of the layer for delimiting an area comprising a part of the objects. An assembly formed by the masks, the layer and a recess layer are etched to eliminate the masks and the transfer layer`s part and to hollow out a part of the recess layer situated under the area such that the objects are suspended. The speed of the etching of the recess layer is greater than the etching speed of the transfer layer and the hard masks. An independent claim is also included for a microelectronic component manufactured according to a sub-micrometric object manufacturing method.
机译:该方法包括在转移层上产生亚微米级的物体(38),并在该层的一部分上制作硬掩模,以划定包括一部分物体的区域。蚀刻由掩模,层和凹进层形成的组件,以去除掩模和转移层的一部分,并挖空位于该区域下方的凹进层的一部分,以使物体被悬挂。凹陷层的蚀刻速度大于转印层和硬掩模的蚀刻速度。还包括根据亚微米物体制造方法制造的微电子部件的独立权利要求。

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