首页> 外国专利> MAGNETIC FIELD DISTRIBUTION MEASURING DEVICE, TEMPERATURE DISTRIBUTION MEASURING DEVICE, MAGNETIC FIELD DISTRIBUTION MEASURING METHOD, AND TEMPERATURE DISTRIBUTION MEASURING METHOD

MAGNETIC FIELD DISTRIBUTION MEASURING DEVICE, TEMPERATURE DISTRIBUTION MEASURING DEVICE, MAGNETIC FIELD DISTRIBUTION MEASURING METHOD, AND TEMPERATURE DISTRIBUTION MEASURING METHOD

机译:磁场分布测量装置,温度分布测量装置,磁场分布测量方法和温度分布测量方法

摘要

PPROBLEM TO BE SOLVED: To provide a magnetic field distribution measuring device and a magnetic field distribution measuring method for measuring magnetic field distribution of a magnetic domain recorded in a magnetic recording medium, and to provide a temperature distribution measuring device and a temperature distribution measuring method for measuring temperature distribution in a laser beam spot when the magnetic domain is recorded in a magneto-optical recording medium. PSOLUTION: Gradation data are calculated from image data obtained by observing the magneto-optical recording medium M in which the magnetic domains are recorded by using a polarization microscope, magnetic field distribution is outputted based on magnetic field intensity data calculated from the gradation data, magnetic field distribution of the magnetic domains recorded in the magneto-optical recording medium M is measured, gradation data is calculated from image data obtained by observing the magneto-optical recording medium M being irradiated with a recording laser beam by using the polarization microscope, magnetic field intensity data is calculated from the gradation data, temperature distribution is outputted based on temperature data calculated from the magnetic field intensity data and temperature distribution in the laser beam spot when the magnetic domains are recorded in the magneto-optical recording medium M is measured. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:<解决的问题:提供一种用于测量记录在磁记录介质中的磁畴的磁场分布的磁场分布测量装置和磁场分布测量方法,并提供温度分布测量装置和温度分布测量方法,用于在将磁畴记录在磁光记录介质中时测量激光束点中的温度分布。

解决方案:灰度数据是通过观察通过使用偏振显微镜记录了磁畴的磁光记录介质M所获得的图像数据计算得出的,磁场分布是根据从灰度计算出的磁场强度数据输出的数据,测量记录在磁光记录介质M中的磁畴的磁场分布,从通过使用偏振显微镜观察被记录激光束照射的磁光记录介质M而获得的图像数据计算灰度数据。当从磁光记录介质M记录磁畴时,根据灰度数据计算出磁场强度数据,根据从磁场强度数据计算出的温度数据和激光束点的温度分布,输出温度分布。测量。

版权:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2008165874A

    专利类型

  • 公开/公告日2008-07-17

    原文格式PDF

  • 申请/专利权人 FUNAI ELECTRIC CO LTD;

    申请/专利号JP20060352690

  • 发明设计人 IZAWA FUMIHITO;

    申请日2006-12-27

  • 分类号G11B5/84;G11B11/105;G11B5;G11B7/0045;G01R33/10;G01R33/12;G01R33/02;G01K11/12;

  • 国家 JP

  • 入库时间 2022-08-21 20:24:44

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