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FOCUS ADJUSTING DEVICE, INSPECTING DEVICE, FOCUS ADJUSTING METHOD, FOCUS ADJUSTING PROGRAM, AND RECORDING MEDIUM READABLE BY COMPUTER

机译:重点调整设备,检查设备,重点调整方法,重点调整程序以及记录可通过计算机读取的介质

摘要

PROBLEM TO BE SOLVED: To adjust focus suitable for inspecting a panel to be inspected.;SOLUTION: The inspecting device 1 has an image analyzing section 61. For a liquid crystal panel 50 in which at least one defect picture element and a plurality of satisfactory picture elements near the defect picture element are lighted on, the image analyzing section 61 associates pickup images taken a number of times while the focusing position of an imaging device 2 is altered, with focus position information indicating focusing positions located when the pickup images are photographed. The image analyzing section 61 also calculates an artificial defect picture element contrast value and a satisfactory picture element contrast value for each of the pickup images, and calculates the degree of separation from the defect, which indicates the degree of difference between the calculated artificial defect picture element contrast value and the calculated satisfactory picture element contrast value. The inspecting device 1 also has a focusing position determining section 64 that determines the focusing position of the imaging device 2 based on the degree of separation, calculated by the image analyzing section 61.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:调整适合于检查被检查面板的焦点;解决方案:检查装置1具有图像分析部分61。对于液晶面板50,其中至少一个缺陷像素和多个令人满意的像素缺陷像素附近的像素点亮,图像分析部61将在改变成像装置2的聚焦位置的同时拍摄多次的拾取图像与表示在拍摄拾取图像时所位于的聚焦位置的聚焦位置信息相关联。 。图像分析部61还针对每个拾取图像计算人工缺陷像素对比度值和令人满意的像素对比度值,并计算与缺陷的分离程度,其指示所计算的人工缺陷图像之间的差异程度。元素对比度值和计算出的令人满意的像素对比度值。检查装置1还具有聚焦位置确定部64,该聚焦位置确定部64基于由图像分析部61计算出的分离度来确定成像装置2的聚焦位置。版权所有:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2008256990A

    专利类型

  • 公开/公告日2008-10-23

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP20070099911

  • 发明设计人 IWAMA HARUYUKI;

    申请日2007-04-05

  • 分类号G02B7/28;G03B13/36;G02B7/36;H04N5/66;H04N17/00;

  • 国家 JP

  • 入库时间 2022-08-21 20:24:29

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