首页> 外国专利> SEPARATING METHOD OF ORGANIC HALOGEN GROUP, MEASURING METHOD OF LOW-VOLATILITY ORGANIC HALOGENS CONCENTRATION, AND MEASURING METHOD OF DIOXINS CONCENTRATION

SEPARATING METHOD OF ORGANIC HALOGEN GROUP, MEASURING METHOD OF LOW-VOLATILITY ORGANIC HALOGENS CONCENTRATION, AND MEASURING METHOD OF DIOXINS CONCENTRATION

机译:有机卤素基团的分离方法,低挥发性有机卤素浓度的测定方法和二恶英浓度的测定方法

摘要

PPROBLEM TO BE SOLVED: To selectively separate organic halogens showing high concentration correlativity with the dioxins concentration in gas to be measured such as exhaust gas, to measure the organic halogens concentration in the gas to be measured, and to accurately determine the dioxins concentration. PSOLUTION: The gas to be measured is introduced into first and second adsorption cylinders 4 and 5, is brought into contact with adsorbent with a superficial area of 10-240 mSP2/SP/g at an adsorption temperature of 50-200 °C. Low-volatility organic halogens are selectively adsorbed of the organic halogen group contained in the gas to be measured, the low-volatility organic halogens are desorbed from the adsorbent, desorption gas is decomposed by a thermal decomposition device 8, the hydrogen halide concentration in the decomposed gas is measured by an analyzing apparatus 9, this value is fed to a data processor 10, the low-volatility organic halogens concentration is determined, and the dioxins concentration is determined based on this. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:

要解决的问题:选择性地分离出与待测气体(例如废气)中的二恶英浓度具有高浓度相关性的有机卤素,以测量待测气体中有机卤素的浓度,并准确确定二恶英浓度。

解决方案:将待测气体引入第一和第二吸附筒4和5,使其在吸附时与表面积为10-240 m 2 / g的吸附剂接触温度为50-200℃。将低挥发性有机卤素选择性地吸附在待测气体中所含的有机卤素基团中,将低挥发性有机卤素从吸附剂中解吸出来,通过热分解装置8分解解吸气体,使氢在反应器中的卤化氢浓度升高。通过分析装置9测量分解的气体,将该值馈送到数据处理器10,确定低挥发性有机卤素的浓度,并据此确定二恶英的浓度。

版权:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2008180632A

    专利类型

  • 公开/公告日2008-08-07

    原文格式PDF

  • 申请/专利权人 ELECTRIC POWER DEV CO LTD;

    申请/专利号JP20070014937

  • 申请日2007-01-25

  • 分类号G01N30/88;G01N33/00;G01N31/00;G01N30/00;G01N30/04;G01N30/06;G01N30/54;G01N31/16;

  • 国家 JP

  • 入库时间 2022-08-21 20:22:08

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