首页>
外国专利>
A method for determining the local emissivity distribution of superthermal electrons.
A method for determining the local emissivity distribution of superthermal electrons.
展开▼
机译:一种确定过热电子局部发射率分布的方法。
展开▼
页面导航
摘要
著录项
相似文献
摘要
The invention concerns a process for determining a local emissivity profile of suprathermal electrons coming from an ionized gas ring placed in a toric vessel, with the use of tomographic inversion by means of Bessel functions Jo of order 0 which exploits line-integrated measurements acquired by current real-time Hard-X-Ray diagnostics.
展开▼