首页> 外国专利> DIFFERENT-SHAPE SAMPLE HOLDER FOR UNDERFACE IRRADIATION FLUORESCENT X-RAY ANALYSIS, AND UNDERFACE IRRADIATION TYPE FLUORESCENCE X-RAY SPECTROMETER EQUIPPED THEREWITH

DIFFERENT-SHAPE SAMPLE HOLDER FOR UNDERFACE IRRADIATION FLUORESCENT X-RAY ANALYSIS, AND UNDERFACE IRRADIATION TYPE FLUORESCENCE X-RAY SPECTROMETER EQUIPPED THEREWITH

机译:用于地下辐照荧光X射线分析的不同形状的样品夹,以及配备的地下辐照型荧光X射线光谱仪

摘要

PROBLEM TO BE SOLVED: To provide a sample holder for underface irradiation fluorescent X-ray analysis used for the fluorescent X-ray analysis of various samples having different shapes, and an underface irradiation type fluorescence X-ray spectrometer equipped therewith, to effectuate thereby analytical work for the different shape samples, and to reduce thereby an expense therefor.;SOLUTION: This different-shape sample holder for the underface irradiation fluorescent X-ray analysis used for irradiating an underface of the sample with a primary X-ray to conduct the fluorescent X-ray analysis is provided with a frame body 2, four holding arms 11-14 having a support part 31 supported rotatably onto the frame body 2 in one end, having a sample abutting part 41 abutting on the underface Sa of the sample and a grasping part 51 for grasping a sideface of the sample in the other end, and having an arm part 61 extended from the support part 31 to the grasping part 51, the holding arms 11-14 are supported on the frame body 2 by support parts 31-34 to position an abutting face abutting on the underface Sa of the sample in each abutting part, on the same plane, and the sample S is held in an inner side of a circumference of the frame body 2, by the abutting parts 41-44 and the grasping part 51-54.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供用于对具有不同形状的各种样品进行荧光X射线分析的用于底面照射荧光X射线分析的样品保持器,以及配备有其的底面照射型荧光X射线光谱仪,从而实现分析。解决方案:此不同形状的样品架用于进行底面辐射荧光X射线分析,用于通过一次X射线对样品的底面进行辐照,以进行荧光X射线分析装置包括:框体2;四个保持臂11-14,其一端具有可旋转地支撑在框体2上的支撑部31;以及,样品抵接部41,其与样品的底面Sa抵接;以及保持臂11〜14a,其把持部11、14a从保持部31延伸到把持部51,该把持部51用于把持另一侧的侧面,该把持部51从支承部31延伸。通过支撑部31-34支撑在框体2上,并且在每个抵接部中将与试样的底面Sa抵接的抵接面定位在同一平面上,并且将试样S保持在框体2的周缘的内侧。框架体2,由邻接部分41-44和抓握部分51-54组成;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008128925A

    专利类型

  • 公开/公告日2008-06-05

    原文格式PDF

  • 申请/专利权人 RIGAKU INDUSTRIAL CO;

    申请/专利号JP20060316585

  • 发明设计人 OGITA KATSUMI;KAMATA SHIGEO;

    申请日2006-11-24

  • 分类号G01N23/223;

  • 国家 JP

  • 入库时间 2022-08-21 20:21:25

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