Test pattern generating apparatus, circuit designing apparatus, test pattern generating method, circuit designing method, test pattern generating program and circuit designing program

摘要

A test pattern generating apparatus comprises a circuit data read in section 11 that divides circuit data into a plurality of functional blocks, a correspondence setting up table preparing section 12 that sorts the plurality of functional blocks into test pattern generating object blocks and test pattern copying object blocks that are configurationally identical with the test pattern generating object blocks and sets up correspondence of the test pattern generating object blocks to the test pattern copying object blocks, a test pattern generating section 13 that generates a test pattern of each of the test pattern generating object blocks and a test pattern copying section 14 that copies the test pattern of each of the test pattern copying object blocks and uses it as test pattern of the test pattern copying object block.