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AN ANTI-FUSE CIRCUIT FOR THROUGHPUT IMPROVEMENT AND A CIRCUIT FOR CHECKING SHORT OF THE ANTI-FUSE

机译:用于抗扰度改进的反熔丝电路和用于检查反熔丝短路的电路

摘要

An anti-fuse circuit for throughput improvement and a circuit for checking short of an anti-fuse are provided to increase the number of anti-fuses capable of being short within a constant time through a program corresponding to each equipment, by preventing a current flowing in the anti-fuse after the anti-fuse is blown. At least one anti-fuse(220) becomes short-circuit according to program operation, and has a variable resistance value. At least one comparison resistor(230) becomes a reference to prevent a current flowing in the anti-fuse. At least one current blocking part(240) determines to prevent the current flowing in the anti-fuse by comparing the resistance value of the anti-fuse with the comparison resistor during program operation.
机译:提供用于提高吞吐量的反熔丝电路和用于检查反熔丝短路的电路,以通过防止电流流动,通过与每个设备相对应的程序来增加能够在恒定时间内短路的反熔丝的数量。在反熔丝吹完后在反熔丝中。至少一个反熔丝(220)根据编程操作而短路,并且具有可变的电阻值。至少一个比较电阻器(230)成为参考,以防止电流在反熔丝中流动。至少一个电流阻挡部分(240)通过在编程操作期间将反熔丝的电阻值与比较电阻器进行比较来确定防止电流在反熔丝中流动。

著录项

  • 公开/公告号KR20080010619A

    专利类型

  • 公开/公告日2008-01-31

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20060070882

  • 发明设计人 SEO EUN SUNG;

    申请日2006-07-27

  • 分类号G11C29/04;

  • 国家 KR

  • 入库时间 2022-08-21 19:54:13

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