首页> 外国专利> Measuring device for complex coherence degree of interference pattern of two optical fields, has device for converting gauss shaped-mode structure of optical field into Gauss-Laguerre-mode structure

Measuring device for complex coherence degree of interference pattern of two optical fields, has device for converting gauss shaped-mode structure of optical field into Gauss-Laguerre-mode structure

机译:用于两个光场的干涉图样的复杂相干度的测量装置,具有将光场的高斯形模结构转换成高斯-拉格勒模结构的装置

摘要

The device has a device (3) for converting a gauss shaped-mode structure of an optical field (1) into a Gauss-Laguerre-mode structure. The device (6) superimposes the optical field with a Gauss-Laguerre-mode structure and the other optical field with a gauss-shaped fashion structure for producing the interference pattern (11). A detection device (13) is provided to detect the interference pattern. An independent claim is also included for a measuring method for a complex coherence measure of an interference pattern of two optical fields.
机译:该装置具有用于将光场(1)的高斯形状模式结构转换成高斯-拉格勒模式结构的设备(3)。装置(6)将具有高斯-拉格勒模式结构的光场与具有高斯形时尚结构的另一光场叠加以产生干涉图案(11)。提供检测装置(13)以检测干涉图案。还包括一种用于对两个光场的干涉图案进行复相干测量的测量方法的独立权利要求。

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