首页> 外国专利> Scanning microscope e.g. confocal scanning microscope, for use in micro-system technology, has signal detector arranged in optical path such that radiation is formed on detector, where focusing device is connected with scanner control unit

Scanning microscope e.g. confocal scanning microscope, for use in micro-system technology, has signal detector arranged in optical path such that radiation is formed on detector, where focusing device is connected with scanner control unit

机译:扫描显微镜用于微系统技术的共聚焦扫描显微镜,其信号探测器安装在光路中,从而在探测器上形成辐射,聚焦装置与扫描仪控制单元相连

摘要

The microscope has a light source emitting measuring radiation on an object (6). The radiation reflected by the object as reflection radiation enters in an optical path. A scanner control unit (11) controls a sliding unit (10) by control signals. A signal detector is arranged in the optical path such that the reflection radiation is formed on the detector, where a focusing device (16) is connected with the control unit. The control unit controls a signal storage unit (13) such that the series of measurement with two measuring signals is stored for a measuring point on the object.
机译:显微镜具有在物体(6)上发射测量辐射的光源。被物体反射为反射辐射的辐射进入光路。扫描仪控制单元(11)通过控制信号控制滑动单元(10)。信号检测器布置在光路上,使得在检测器上形成反射辐射,其中聚焦装置(16)与控制单元连接。控制单元控制信号存储单元(13),使得针对对象上的测量点存储具有两个测量信号的一系列测量。

著录项

  • 公开/公告号DE102006028409A1

    专利类型

  • 公开/公告日2007-12-20

    原文格式PDF

  • 申请/专利权人 POLYTEC GMBH;

    申请/专利号DE20061028409

  • 发明设计人 ARMBRUSTER BERND;REMBE CHRISTIAN;

    申请日2006-06-19

  • 分类号G01B11/24;G02B21/00;G01B9/02;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:56

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