首页> 外国专利> Three-dimensional and lengthwise-running testing contour e.g. recess, irregularity testing method, involves recording longitudinal positions of contour from different angles, where angles are observed in side view towards running direction

Three-dimensional and lengthwise-running testing contour e.g. recess, irregularity testing method, involves recording longitudinal positions of contour from different angles, where angles are observed in side view towards running direction

机译:三维纵向运行的测试轮廓凹槽,不规则性测试方法,涉及从不同角度记录轮廓的纵向位置,在侧视图中朝运行方向观察角度

摘要

The method involves moving a testing head (6) relative to a testing contour e.g. recess (2a) in a running direction. Longitudinal positions of the contour are recorded from different angles, where the angles are observed in a side view towards the running direction of the testing contour. The contour is covered in the process direction. Images of the contour are received from optical sensors (12, 12`). Check is made whether an image has a small irregularity, which is in the form of a hole. An independent claim is also included for a testing head comprising optical sensors.
机译:该方法包括相对于测试轮廓例如相对于测试轮廓移动测试头(6)。在运行方向上的凹口(2a)。从不同角度记录轮廓的纵向位置,其中在侧视图中朝着测试轮廓的运行方向观察这些角度。轮廓在加工方向上被覆盖。从光学传感器(12、12`)接收轮廓的图像。检查图像是否具有小的不规则性,该不规则性是孔的形式。对于包括光学传感器的测试头也包括独立权利要求。

著录项

  • 公开/公告号DE102006036586A1

    专利类型

  • 公开/公告日2008-02-14

    原文格式PDF

  • 申请/专利权人 REITER MATHIAS;

    申请/专利号DE20061036586

  • 发明设计人 REITER MATHIAS;

    申请日2006-08-04

  • 分类号G01B11/25;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:49

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